第一吃瓜

Electron Backscatter Diffraction (EBSD)

In geology, electron backscatter diffraction (EBSD) is a powerful tool for the observation and analysis of microstructures and for phase identification.

Overview

第一吃瓜 College's first electron backscatter diffraction (EBSD) system was purchased with funds awarded through the NSF Major Research Instrumentation (MRI) program (proposal 0320871 funded to Rachel Beane). In 2016, an upgraded instrument was purchased with funds awarded through the NSF MRI program (proposal 1530963 awarded to Emily Peterman and Rachel Beane).

Features

The EBSD system, by Oxford Instruments, includes a NordlysMax3 EBSD Detector, forescatter detectors, and software used for orientation mapping (stage and beam control), texture determination, and phase identification (using the American Mineralogist Geological Phase database).

The system is attached to the Tescan VEGA3 LMU VP SEM (variable pressure scanning electron microscope) and often works in tandem with the Oxford Instruments X-Max50 energy dispersive spectrometer (EDS) for measuring mineral chemistry.

How it Works

The EBSD system uses backscattered electrons (BSE) emitted from a specimen in a SEM to form a diffraction pattern that is imaged on a phosphor screen.

Analysis of the diffraction pattern allows identification of the phase and its crystal lattice orientation.

The scanning and mapping capabilities of the system permit rapid acquisition of data, from polished rock thin sections and (bio)mineral specimens, at sub-micron resolutions.

Among other uses, these data may be applied to evaluate crystallographic preferred orientations (CPO) of mineral fabrics, and to examine misorientation axes and angles that may signify processes such as subgrain development and dislocation creep.

Researchers interested in applying EBSD methods to textural problems in rocks are encouraged to contact Professor Rachel Beane or Professor Emily Peterman for possible collaborations.
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Methods

The typical methods this lab uses for collection and processing of EBSD data follow. Specific projects will vary from these methods.

Electron backscatter diffraction (EBSD) analyses are conducted at 第一吃瓜 College on a Tescan VEGA3 SEM outfitted with an Oxford Instruments NordlysMax3 detector. Data were processed using AZtec and Channel 5 software. Samples are prepared by affixing standard polished thin sections to a halved brass rods (M. Cheadle, personal communication) and polishing an additional three hours in a non-crystallizing colloidal silica suspension on a Buehler Vibromet2 vibratory polisher (SYTON method of Fynn and Powell, 1979).

Thin sections are coated with a thin (ca. 5 nm) carbon coat to minimize charge. For samples that are not carbon coated, charging is minimized by using a chamber pressure of 10-15 Pa, combined with the 70° tilt. Operating parameters for collecting EBSD patterns are an accelerating voltage of 20kV, working distance of 25 mm, and probe current of 1-3nA.

Channel 5 acquisition and indexing settings vary by phase, but typical values are 2x2 or 4x4 binning, high gain, Hough resolution=60, 8 bands, and 80 reflectors. Mean angular deviations between the detected Kikuchi bands and the simulations are less than 1.3 degrees (and often less than 0.8 degrees). Data are post-processed by removing wild spikes, removing observed systematic misindexing, and by extrapolating zero solutions based on 4-6 neighbors (if required).